The National Instruments PXIe-6571 is a 1-slot, 100 MVector/s PXI digital pattern instrument. It is designed for applications that require high-speed digital I/O, such as semiconductor test, power electronics test, and ATE.
The PXIe-6571 has 32 channels of digital I/O, each of which can be configured as an input, output, or bidirectional line. The instrument can generate digital patterns at up to 100 MHz, and it can acquire digital data at up to 100 MS/s. The PXIe-6571 also supports a variety of triggering and synchronization options, making it ideal for complex test applications.
Here are some of the key features of the National Instruments PXIe-6571:
- 32 channels of digital I/O
- Up to 100 MHz pattern generation
- Up to 100 MS/s data acquisition
- Multiple triggering and synchronization options
- PXI Express interface
- Compact form factor
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