The National Instruments PXIe-6570 is a 32-channel digital pattern instrument intended for applications like semiconductor characterization and production testing. It’s a powerful tool for generating and analyzing digital signals with various features:
Key specifications:
- 100 MHz vector rate: Generates and acquires digital patterns at up to 100 million samples per second per channel.
- 32 channels: Supports testing of multiple devices or components simultaneously.
- 128M per channel vector memory depth: Store large and complex patterns for extensive testing scenarios.
- Multiple pattern formats: Generate various digital signal formats like non-return-to-zero, return-to-low, and return-to-high.
- 31 time sets for pattern timing: Precisely control the timing of different parts of the generated patterns.
- Multisite testing, up to 8 sites: Synchronize multiple PXIe-6570 modules for testing larger systems or multiple devices in parallel.
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