The National Instruments PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. It is designed for testing a wide range of electronic devices, including semiconductors, sensors, and actuators.
The PXIe-4162 has the following features:
- ±24 V, 100 pA precision voltage and current sourcing and sink
- 20 Hz to 20 MHz bandwidth
- 1 µA to 100 mA current range
- 1 mΩ to 100 GΩ resistance range
- SourceAdapt technology for optimizing transient response
- Built-in guards for reducing leakage currents
- Multiple measurement modes, including DC, pulse, sweep, and transient
The PXIe-4162 is ideal for a variety of applications, including:
- Semiconductor characterization
- Device modeling
- Failure analysis
- Production test
- Research and development
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