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KLA 073-404555-00 High Precision Metrology Module

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The KLA 073-404555-00 is a high-precision metrology module designed for semiconductor manufacturing processes. It provides accurate measurements for critical dimension (CD), overlay, and film thickness control, ensuring superior quality and consistency in chip production.

SKU: 11401613

Manufacturer:KLA

Model Number:073-404555-00

Module Type:Metrology Module

Measurement Accuracy:± 0.1 nm

Measurement Range:0.1 µm to 10 µm

Resolution:0.01 nm

Environmental Conditions:Operating Temp: 15°C to 35°C, Humidity: 20% to 80%

Power Requirements:220 VAC ± 10%, 50/60 Hz

    The KLA Tencor 073-404555-00 is meticulously designed to meet the stringent requirements of semiconductor manufacturing processes.

     With its high precision and reliability, it ensures that every critical dimension and feature of a wafer or device can be accurately measured and controlled.

     The compact design allows for easy integration into existing production lines, minimizing downtime and maximizing efficiency.

     The robust construction and wide operating temperature range make it suitable for challenging industrial environments.

     Advanced communication interfaces like Ethernet and USB facilitate seamless data exchange and real-time monitoring, enhancing process control and quality assurance.

KLA KLA 073-404555-00

KLA KLA 073-404555-00

KLA KLA 073-404555-00

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